| Novel Near-Field Microwave Substrate Integrated Waveguide Horn Sensor with One Input for Non-Destructive Detection of Surface Cracks in Metals |
| کد مقاله : 1048-IRNDT |
| نویسندگان |
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سپیده بشیری *1، سید حسین(حسام الدین) صادقی1، رضا صراف شیرازی1، ایمان آهنیان2 1دانشگاه صنعتی امیرکبیر 2دانشگاه آزاد اسلامی واحد تهران جنوب |
| چکیده مقاله |
| Metal parts are prone to surface fractures owing to a variety of circumstances, and they must be fixed or replaced in the shortest possible time to avoid irreversible damage. The paper presents a microwave probe based on integrated substrate waveguide technology with two orthogonal polarizations in Ku-band and one input port, capable of detecting targets in any direction. The new probe is composed of up of two SIW horn waveguides that are perpendicular to each other and has the lowest coupling compared to previous probes. The wave is sent to the coupled horn waveguide through a coupling via designed in the feeding horn waveguide. The proposed probe can detect a crack by viewing it as a rectangular waveguide that interacts with two orthogonal waveguides. The probe's features were confirmed using numerical simulation tools. The probe's capacity to detect the crack has also been demonstrated using numerical simulation tools and associated relationships. |
| کلیدواژه ها |
| Keywords: Microwave non-destructive testing, Dual-polarizations, Crack, Near-field, SIW-Horn probe |
| وضعیت: پذیرفته شده برای ارائه شفاهی |
